X-ray diffraction (XRD) is an effective non-destructive tool for identifying solid crystalline samples. XRD analysis provides information about structure, phases, crystal orientations and other structural features; these includes mean grain size, stress, lattice errors and degree of crystallization. X-ray diffraction peaks are consequence of diffracted monochromatic X-ray’s constructive interference from different lattice planes with different angles. The intensity of peaks are determined by the orientations of atoms in the crystal lattice. The X-ray diffraction pattern is a samples finger print, the periodic atomic arrangements in a sample. X-ray diffraction patterns are identified by comparing them with ICDD-standard database patterns.

Main Applications of XRD Analysis
- XRD Uses
- Phase detection, solid and crystalline samples
- Phase ratio relations from a sample with many phases (Rietweld analysis)
- 1-crystalline matter orientation solving
Typical samples
- Process products in mining industry
- Definition of clays found in joints in underground cavaties, especially ratio between clay minerals in swallowing clays
- Mineral identification
- Mineral ratios for samples with many phases
- Asbestos
- Phase identification for a large variety of bulk and thin-film samples
- Detecting crystalline minority phases (at concentrations greater than ~1%)
- Determining crystallite size for polycrystalline films and materials
- Determining percentage of material in crystalline form versus amorphous
- Measuring sub-milligram loose powder or dried solution samples for phase identification
- Analyzing films as thin as 50 angstroms for texture and phase behaviors
- Determining strain and composition in epitaxial thin films
- Determining surface offcut in single crystal materials
- Measuring residual stress in bulk metals and ceramics
- Signal Detected: Diffracted x-rays
- Elements Detected: All elements, assuming they are present in a crystalline matrix
- Detection Limits: Quantitative multiphase analysis: ~1%
- External standard quantitative analysis: ~0.1%
- Special quantitative analysis (quartz, polymorphs): ~0.02%
- Minimum film thickness for phase identification: ~20 Angstroms
- Depth Resolution: Adjustable sampling depth between ~20 Angstroms to ~30 microns, depending on material properties and x-ray incidence angles
- Imaging/Mapping: None
- Lateral Resolution/Probe Size: Point focus: 0.1mm to 0.5mm; Line focus 2mm to 12 mm
- Nondestructive
- Quantitative measurement of phase contents and texture orientation
- Minimal or no sample preparation requirements
- Ambient conditions for all analysis
- Cannot identify amorphous materials
- No depth profile information
- Minimum spot size of ~50um
- Aerospace
- Automotive
- Medical Implants
- Compound Semiconductor
- Data Storage
- Displays
- Electronics
- Industrial Products
- Lighting
- Pharmaceutical
- Photonics
- Polymer
- Semiconductor
- Solar Photovoltaics