XRD

X-ray diffraction (XRD) is an effective non-destructive tool for identifying solid crystalline samples. XRD analysis provides information about structure, phases, crystal orientations and other structural features; these includes mean grain size, stress, lattice errors and degree of crystallization. X-ray diffraction peaks are consequence of diffracted monochromatic X-ray’s constructive interference from different lattice planes with different angles. The intensity of peaks are determined by the orientations of atoms in the crystal lattice. The X-ray diffraction pattern is a samples finger print, the periodic atomic arrangements in a sample. X-ray diffraction patterns are identified by comparing them with ICDD-standard database patterns.