Energy Dispersive X-ray Spectroscopy (EDS) is an analytical tool which can be used in association with SEM (Scanning Electron Microscopy). These tools provide an image and EDS can be used in element analysis from areas with a minimum size of a few microns. A beam of electrons is used to excite the sampel to emit characteristic X-rays from each specific element in the sample and these characteristic X-rays are detected. SEM can be used on small lateral targets to identify elemental distribution.
STENMAN MINERAL AB is utilizing a fully modernized JEOL JXA-8600 electron probe micro analysator. Due the analytical characteristics of the equipment, imaging properties are not at the same level as with an conventional SEM, but elemental analysis are much more precise.
Evans Analytical Group’s® (EAG) multiple XRD systems are X-ray Diffraction, XRD Analysisequipped with optical modules that can be exchanged, depending on the analysis requirement, without affecting the accuracy of positioning. It is simple to change between line and point focus of the x-ray tube, enabling simple switching from a regular XRD configuration to a high-resolution XRD configuration. Different combinations of optical modules enable the analysis of powders, coatings, thin films, slurries, fabricated parts, or epitaxial films.
Main Applications of XRD Analysis
- Identification/quantification of crystalline phase
- Measurement of average crystallite size, strain, or micro-strain effects in bulk and thin-film samples
- Quantification of preferred orientation (texture) in thin films, multi-layer stacks, and manufactured parts
- Determination of the ratio of crystalline to amorphous material in bulk materials and thin-film samples
Elemental composition for small targets
Versatile and cheap
Quantitative for some sample types; homogenic, flat and polished samples
Quick firslook for chemical composition
Limited size for samples
Is not well compatible with wet organic samples
Dirty or oxidized sample surface can ruin the analyze
Low Z elements hard to identify
Samples which are not polished or are heterogenic or not flat are hard targets
Detects: Characteristic x-rays
Detection limits: 0.1-1 at
Imaging and mapping: Yes
Probe size: > 0.3 μm