Energy Dispersive X-ray Spectroscopy (EDS) is an analytical tool which can be used in association with SEM (Scanning Electron Microscopy). These tools provide an image and EDS can be used in element analysis from areas with a minimum size of a few microns. A beam of electrons is used to excite the sampel to emit characteristic X-rays from each specific element in the sample and these characteristic X-rays are detected. SEM can be used on small lateral targets to identify elemental distribution.

STENMAN MINERAL AB is utilizing a fully modernized JEOL JXA-8600 electron probe micro analysator. Due the analytical characteristics of the equipment, imaging properties are not at the same level as with an conventional SEM, but elemental analysis are much more precise.

Evans Analytical Group’s® (EAG) multiple XRD systems are X-ray Diffraction, XRD Analysisequipped with optical modules that can be exchanged, depending on the analysis requirement, without affecting the accuracy of positioning. It is simple to change between line and point focus of the x-ray tube, enabling simple switching from a regular XRD configuration to a high-resolution XRD configuration. Different combinations of optical modules enable the analysis of powders, coatings, thin films, slurries, fabricated parts, or epitaxial films.

Main Applications of XRD Analysis

  • Identification/quantification of crystalline phase
  • Measurement of average crystallite size, strain, or micro-strain effects in bulk and thin-film samples
  • Quantification of preferred orientation (texture) in thin films, multi-layer stacks, and manufactured parts
  • Determination of the ratio of crystalline to amorphous material in bulk materials and thin-film samples
Ideal uses

Elemental composition for small targets


Versatile and cheap

Quantitative for some sample types; homogenic, flat and polished samples

Quick firslook for chemical composition


Limited size for samples

Is not well compatible with wet organic samples

Dirty or oxidized sample surface can ruin the analyze

Low Z elements hard to identify

Samples  which are not polished or are heterogenic or not flat are hard targets

Technical specifications

Detects: Characteristic x-rays

Detection limits: 0.1-1 at

Elements: B-U

Imaging and mapping: Yes

Probe size: > 0.3 μm

Target industries






Industrial supplies