EDS

Energy Dispersive X-ray Spectroscopy (EDS) is an analytical tool which can be used in association with SEM (Scanning Electron Microscopy). These tools provide an image and EDS can be used in element analysis from areas with a minimum size of a few microns. A beam of electrons is used to excite the sampel to emit characteristic X-rays from each specific element in the sample and these characteristic X-rays are detected. SEM can be used on small lateral targets to identify elemental distribution.

STENMAN MINERAL AB is utilizing a fully modernized JEOL JXA-8600 electron probe micro analysator. Due the analytical characteristics of the equipment, imaging properties are not at the same level as with an conventional SEM, but elemental analysis are much more precise.

Evans Analytical Group’s® (EAG) multiple XRD systems are X-ray Diffraction, XRD Analysisequipped with optical modules that can be exchanged, depending on the analysis requirement, without affecting the accuracy of positioning. It is simple to change between line and point focus of the x-ray tube, enabling simple switching from a regular XRD configuration to a high-resolution XRD configuration. Different combinations of optical modules enable the analysis of powders, coatings, thin films, slurries, fabricated parts, or epitaxial films.